本文選題：平面度 + C8051F�。� 參考：《西華大學》2012年碩士論文

【摘要】：隨著電子技術的不斷發(fā)展，平板技術已經(jīng)越來越多的應用于電子產(chǎn)品之中，平板產(chǎn)品平面的平整度是決定平板產(chǎn)品質(zhì)量的重要因素。因而國家質(zhì)量監(jiān)督檢驗檢疫總局在2005年03月頒布了平板檢測相關規(guī)程，對平板工作面平面度參數(shù)進行統(tǒng)一規(guī)范，并規(guī)定平面度最大誤差及相應平板準確度級別等。本文依據(jù)國家計量檢定規(guī)程，并結合市場實際檢測精度指標要求，提出并實現(xiàn)了一種較為經(jīng)濟的平板平面度檢測方案，實現(xiàn)在線批量檢測。 提出了基于混合信號片上系統(tǒng)型單片機C8051F的智能平板平面度檢測系統(tǒng)設計方案。系統(tǒng)依據(jù)對角線布點評定法則為基準，采用最小條件原則評定方法，利用SOC系統(tǒng)級MCU芯片為采集器智能核心，通過多路電渦流位移傳感器，完成對待測平板的數(shù)據(jù)采集。運用Modbus協(xié)議組成工業(yè)級232網(wǎng)絡，完成與上位機握手通訊。上位機采用LabVIEW開發(fā)設計程控界面，結合Access數(shù)據(jù)庫技術，實現(xiàn)待檢測平板數(shù)據(jù)的采集和歷史采集信息的查詢、管理等操作。 本文的主要工作包括以下幾個方面： (1)研究平板平面度檢測相關評定準則。根據(jù)實際檢測平面度允許最大誤差基準，選擇電渦流位移傳感器，按照對角線布點評定法則布點測量。對待檢測平板選取合適基準平面，并采用12點布點測量，計算所有測量點相對于理想平面的偏差，其最大值與最小值之差即為待測平板平面度。采用對角線法則進行誤差評定后，原始測量數(shù)據(jù)轉換為相對于基準平面的數(shù)據(jù)，按照最小條件原則進行評定，驗證平面度測量結果。 (2)提出了以高度集成的SOC系統(tǒng)級MCU芯片為核心的智能采集系統(tǒng)。系統(tǒng)采用傳感器采集平板位移信號，利用多路模擬開關切換選通模擬信號輸入，通過儀表放大電路進行信號的前端放大。數(shù)據(jù)采集系統(tǒng)芯片內(nèi)置模/數(shù)轉換器ADC，數(shù)/模轉換器DAC，電壓比較器，可編程增益放大器，以及UART通訊接口等，實現(xiàn)單芯片智能采集設計。系統(tǒng)采用Modbus通信協(xié)議RTU傳輸模式實現(xiàn)采集板與PC機通訊，為了防止傳送過程中傳輸錯誤，系統(tǒng)進行CRC校驗整個消息內(nèi)容。 (3)采用圖形化可視軟件LabVIEW開發(fā)設計平板平面度檢測系統(tǒng)上位機程控界面。選通系統(tǒng)采集通道，并采集選通通道零點電壓值；配置串口通訊參數(shù)，采集選通通道電壓數(shù)據(jù)，并依據(jù)采集電壓值轉換為相應檢測值；設定平板檢測合格判據(jù)，，并判斷平板平面度合格狀態(tài)，多次采集，進行檢測數(shù)據(jù)統(tǒng)計；調(diào)用Access數(shù)據(jù)庫，存儲實時檢測數(shù)據(jù)，并可查詢歷史檢測平板合格情況，查詢指定日期測試平板數(shù)據(jù)，對已測數(shù)據(jù)進行刪除、打印等操作處理；設計用戶登錄及密碼修改界面，增強檢測系統(tǒng)安全性。 (4)根據(jù)平板平面度檢測系統(tǒng)需完成功能進行測試。構建函數(shù)發(fā)生器、六位半數(shù)字多用表、PCI-GPIB接口控制器的自動精度校準系統(tǒng)，提高了測量準確度。利用Agilent33220A函數(shù)發(fā)生器模擬12路電渦流位移傳感器產(chǎn)生電位對應電壓信號，采用本檢測系統(tǒng)采集零點電壓值和模擬平板檢測電壓值，驗證檢測合格指示狀態(tài)。按要求查詢歷史檢測數(shù)據(jù)，檢測系統(tǒng)數(shù)據(jù)庫管理功能。測試過程的順利進行，保證了整個檢測系統(tǒng)的正常工作運行。 目前平板電子產(chǎn)品飛速發(fā)展，人們對其質(zhì)量的檢測工作也越來越為重視，介于實際檢測成本和精度的需求，本系統(tǒng)設計不僅性價比高，而且具有完善的數(shù)據(jù)庫管理等功能，目前已在平板平面度檢測線上得到成功應用。
[Abstract]:With the development of electronic technology , flat panel technology has become more and more applicable to electronic products . The flatness of flat panel products is an important factor to determine the quality of flat panel products .

This paper presents a design scheme of the intelligent flat - plate flatness detection system based on the system - type single - chip - based on mixed signal chip . The system is based on the principle of diagonal layout . The system is based on the principle of minimum condition principle . The SOC system - level MCU chip is used as the intelligent core of the collector . By means of the Modbus protocol , the data acquisition of the flat plate is completed . By using the Modbus protocol to form the industrial - level 232 network , the communication with the upper computer is completed . The upper computer uses the LabVIEW to develop the program - controlled interface , and realizes the query , management and other operations of the data acquisition and history collection of the flat data to be detected .

The main work of this paper includes the following aspects :

( 1 ) To study the relevant evaluation criterion of flatness detection of flat plate . Based on the actual detection flatness , the maximum error criterion is selected , the electric eddy current displacement sensor is selected , and the deviation of all measuring points with respect to the ideal plane is calculated according to the difference between the maximum value and the minimum value according to the difference between the maximum value and the minimum value . After the error evaluation is performed by using the diagonal rule , the original measurement data is converted into the data relative to the reference plane , and the flatness measurement result is verified according to the minimum condition principle .

( 2 ) The intelligent acquisition system based on highly integrated SOC system level MCU chip is proposed . The system adopts the sensor to acquire the plate displacement signal , and switches the analog signal input through the multi - way analog switch , amplifies the front end of the signal through the instrument amplifying circuit . The system realizes the single chip intelligent acquisition design by using the Modbus communication protocol RTU transmission mode to realize the communication between the acquisition board and the PC . In order to prevent the transmission error during the transmission process , the system performs the CRC check of the whole message content .

( 3 ) developing the program control interface of the upper computer of the flat - plate flatness detection system by adopting a graphical visual software LabVIEW ;
configuring serial port communication parameters , collecting gated channel voltage data , and converting into corresponding detection values according to the acquired voltage values ;
setting a plate detection eligibility criterion , judging the flatness of the flat plate to be qualified , collecting repeatedly for multiple times , and performing detection data statistics ;
calling an Access database , storing the real - time detection data , and inquiring history detection plate conformity , inquiring the appointed day test plate data , deleting the measured data , printing and the like ;
The user login and password modification interface are designed to enhance the security of the detection system .

( 4 ) The function test system needs to be tested according to the flatness detection system of the flat plate . The automatic precision calibration system of the function generator , the six - bit semi - digital multi - purpose table and the PCI interface controller is constructed , and the measurement accuracy is improved . The detection system is used for simulating 12 paths of electric eddy current displacement sensors to generate potential corresponding voltage signals . The detection system collects the zero voltage value and the analog flat panel detection voltage value , and verifies the test pass indication state . According to the requirement , the history detection data is inquired , and the database management function of the system is detected .

At present , flat - plate electronic products are rapidly developing , and people pay more and more attention to the detection of their quality . The system is not only cost - effective , but also has perfect database management functions , and has been successfully applied on the flat - level detection line .

【學位授予單位】：西華大學
【學位級別】：碩士
【學位授予年份】：2012
【分類號】：TP274;TP368.12

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