數(shù)字示波器硬件實時波形錄制和分析功能設計
發(fā)布時間：2018-09-07 20:45
【摘要】：隨著電子技術的快速發(fā)展,電子工程師對測試測量儀器的要求越來越高,對數(shù)字示波器而言,不僅在帶寬、采樣率、存儲深度這三大指標上有了更高的要求,同時,在示波器各項功能的發(fā)展上也要求更加全面,更多的便捷功能可以在很大程度上提高測試的效率和精度。本文對數(shù)字存儲示波器的硬件波形實時錄制功能和分析功能的設計與實現(xiàn)進行了詳細的闡述,討論了本系統(tǒng)中基于DDR3的大容量存儲技術和分段存儲技術的研究與實現(xiàn),并在此基礎上實現(xiàn)了硬件波形實時錄制的功能;同時完成了硬件極限模板測試技術的總體方案設計,并闡述了其具體的實現(xiàn)過程;且完成了以統(tǒng)計直方圖的方法對波形進行抖動分析的方案研究。本文完成的工作如下:1、高速大容量存儲技術的研究。本文介紹了DDR3的工作機制以及其在系統(tǒng)中深存儲功能的具體實現(xiàn),實現(xiàn)了存儲深度可變,且最大存儲深度能達到800M的大容量存儲功能。2、硬件波形實時錄制功能的設計。在深存儲技術以及分段存儲技術的基礎上,實現(xiàn)了硬件波形實時錄制功能的設計,達到存取速度快、錄制幀數(shù)多、波形實時錄制的設計目標。3、極限模板測試技術的研究。本課題以硬件的設計思想實現(xiàn)模板測試技術,能夠通過創(chuàng)建波形模板的方法對異常波形進行檢測。這種測試方法能很快地從海量波形中檢測出異常的波形,大大提高了測試效率。4、波形抖動分析的研究。首先介紹了三維波形映射的基本原理,再根據(jù)三維數(shù)據(jù)庫與LCD波形顯示區(qū)的地址映射關系,完成了直方統(tǒng)計圖總體方案的設計。從而實現(xiàn)通過直方圖統(tǒng)計的方法分析波形的抖動特性。
[Abstract]:With the rapid development of electronic technology, the requirements of electronic engineers for testing and measuring instruments are becoming higher and higher. For digital oscilloscopes, not only the bandwidth, sampling rate and storage depth have higher requirements, but also, In the development of oscilloscope functions, more comprehensive, more convenient functions can greatly improve the efficiency and accuracy of the test. In this paper, the design and implementation of hardware waveform real-time recording and analysis function of digital storage oscilloscope are described in detail, and the research and implementation of mass storage technology and segmented storage technology based on DDR3 in this system are discussed. On this basis, the function of real-time recording of hardware waveform is realized, and the overall scheme design of hardware limit template testing technology is completed, and the concrete realization process is described. The scheme of waveform jitter analysis by statistical histogram is completed. The work of this paper is as follows: 1, the research of high-speed and large-capacity storage technology. This paper introduces the working mechanism of DDR3 and the realization of its deep storage function in the system. The function of variable storage depth is realized, and the maximum storage depth can reach 800m. The design of real-time recording function of hardware waveform is also presented in this paper. On the basis of deep storage technology and segmented storage technology, the design of hardware waveform real-time recording function is realized, which achieves the design goal of fast access speed, more recorded frames, real-time waveform recording, and limit template testing technology. In this paper, the template testing technology is realized by the hardware design idea, and the abnormal waveform can be detected by creating the waveform template. This method can quickly detect abnormal waveforms from massive waveforms and greatly improve the efficiency of testing .4. the research of waveform jitter analysis. Firstly, the basic principle of 3D waveform mapping is introduced, and then according to the address mapping relationship between 3D database and LCD waveform display area, the overall scheme of straight square statistical diagram is designed. Thus, the jitter characteristics of the waveform can be analyzed by histogram statistics.
【學位授予單位】：電子科技大學
【學位級別】：碩士
【學位授予年份】：2014
【分類號】：TM935.37
本文編號：2229371
[Abstract]:With the rapid development of electronic technology, the requirements of electronic engineers for testing and measuring instruments are becoming higher and higher. For digital oscilloscopes, not only the bandwidth, sampling rate and storage depth have higher requirements, but also, In the development of oscilloscope functions, more comprehensive, more convenient functions can greatly improve the efficiency and accuracy of the test. In this paper, the design and implementation of hardware waveform real-time recording and analysis function of digital storage oscilloscope are described in detail, and the research and implementation of mass storage technology and segmented storage technology based on DDR3 in this system are discussed. On this basis, the function of real-time recording of hardware waveform is realized, and the overall scheme design of hardware limit template testing technology is completed, and the concrete realization process is described. The scheme of waveform jitter analysis by statistical histogram is completed. The work of this paper is as follows: 1, the research of high-speed and large-capacity storage technology. This paper introduces the working mechanism of DDR3 and the realization of its deep storage function in the system. The function of variable storage depth is realized, and the maximum storage depth can reach 800m. The design of real-time recording function of hardware waveform is also presented in this paper. On the basis of deep storage technology and segmented storage technology, the design of hardware waveform real-time recording function is realized, which achieves the design goal of fast access speed, more recorded frames, real-time waveform recording, and limit template testing technology. In this paper, the template testing technology is realized by the hardware design idea, and the abnormal waveform can be detected by creating the waveform template. This method can quickly detect abnormal waveforms from massive waveforms and greatly improve the efficiency of testing .4. the research of waveform jitter analysis. Firstly, the basic principle of 3D waveform mapping is introduced, and then according to the address mapping relationship between 3D database and LCD waveform display area, the overall scheme of straight square statistical diagram is designed. Thus, the jitter characteristics of the waveform can be analyzed by histogram statistics.
【學位授予單位】：電子科技大學
【學位級別】：碩士
【學位授予年份】：2014
【分類號】：TM935.37
【參考文獻】
相關期刊論文 前1條
1 曲文婷;;利用DS6000波形錄制功能加速調試[J];電子產(chǎn)品世界;2011年11期
，本文編號：2229371
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