【摘要】：LED光源具有光效高、使用壽命長(zhǎng)、無(wú)頻閃、節(jié)能等優(yōu)點(diǎn),目前正逐漸取代傳統(tǒng)照明燈具,因此針對(duì)LED燈具中驅(qū)動(dòng)電源的研究已成為電力電子行業(yè)研究的熱門(mén)課題。LED驅(qū)動(dòng)電源的可靠性決定了LED燈具的品質(zhì)和使用壽命的。所以提高LED驅(qū)動(dòng)電源的可靠性具有重要意義。LED燈具作為第四代照明光源,其實(shí)際壽命值與理論值差距非常大,同時(shí)存在LED燈具檢測(cè)標(biāo)準(zhǔn)與檢測(cè)體系不完善的問(wèn)題,缺乏比較較專業(yè)的檢測(cè)手段和科學(xué)的評(píng)價(jià)方法,所以,需要建立一個(gè)快速有效的壽命評(píng)定方法。針對(duì)LED照明燈具中的驅(qū)動(dòng)電源的可靠性進(jìn)行研究,其中主要包括驅(qū)動(dòng)電源中主要元器件的溫升,驅(qū)動(dòng)電源溫升的改進(jìn)調(diào)整,利用Saber軟件仿真分析,分析電子元器件對(duì)驅(qū)動(dòng)電源輸出參數(shù)的影響權(quán)重�？蓪�(duì)驅(qū)動(dòng)電源故障進(jìn)行排查。本文采用雙加速壽命試驗(yàn)方法,提出了一種快速評(píng)價(jià)壽命的方法,結(jié)合試驗(yàn)所得數(shù)據(jù),對(duì)數(shù)據(jù)進(jìn)行整理。提出一種較合理的數(shù)理統(tǒng)計(jì)分析方法。本文主要內(nèi)容有以下幾個(gè)方面:(1)針對(duì)LED燈具樣品,提出以濕度和溫度應(yīng)力同時(shí)作為試驗(yàn)的加速應(yīng)力,以光通量衰減為初始光通量的70%作為失效判據(jù)進(jìn)行檢測(cè),有效縮短了試驗(yàn)時(shí)間;(2)對(duì)LED燈具照明驅(qū)動(dòng)電源進(jìn)行了可靠性的分析,建立了驅(qū)動(dòng)電源的3D模型圖,用仿真軟件對(duì)其進(jìn)行有限元分析;用熱電偶測(cè)溫方法對(duì)驅(qū)動(dòng)電源中電子元器件溫升進(jìn)行實(shí)際測(cè)量,對(duì)仿真結(jié)果進(jìn)行驗(yàn)證,并且針對(duì)測(cè)量數(shù)據(jù)進(jìn)行分析,繼而提出降低驅(qū)動(dòng)電源溫升方法;可提高LED驅(qū)動(dòng)電源的可靠性。(3)通過(guò)試驗(yàn)得出兩種不同應(yīng)力水平下的光通量試驗(yàn)數(shù)據(jù),同時(shí)以威布爾分布來(lái)描述試驗(yàn)樣品的壽命分布,運(yùn)用最小二乘法和阿倫尼斯模型對(duì)試驗(yàn)數(shù)據(jù)進(jìn)行統(tǒng)計(jì)分析,最后推導(dǎo)出正常應(yīng)力水平下燈具的壽命。(4)對(duì)試驗(yàn)中存在的問(wèn)題及試驗(yàn)結(jié)果的不確定性進(jìn)行了分析,為今后LED燈具壽命評(píng)估提供了合理的方案和可靠的數(shù)據(jù)支持。
[Abstract]:Led light source has many advantages, such as high light efficiency, long service life, no stroboscopic, energy saving and so on. At present, it is gradually replacing the traditional lighting lamps and lanterns, so the research on driving power supply in LED lamps has become a hot topic in power electronics industry. The reliability of LED driving power supply determines the quality and service life of LED lamps and lanterns. Therefore, it is of great significance to improve the reliability of LED driving power supply. Led lamps and lanterns, as the fourth generation lighting light source, have a very large gap between the actual life value and the theoretical value. At the same time, there are some problems such as imperfect detection standards and detection system for LED lamps and lanterns, and lack of more professional detection methods and scientific evaluation methods. Therefore, it is necessary to establish a fast and effective life evaluation method. The reliability of driving power supply in LED lighting lamps is studied, including the temperature rise of the main components in the driving power supply, the improvement and adjustment of the temperature rise of the driving power supply, and the influence weight of electronic components on the output parameters of the driving power supply is analyzed by using Saber software simulation analysis. The fault of driving power supply can be checked. In this paper, a rapid life evaluation method is proposed by using the double accelerated life test method, and the data are sorted out according to the test data. A more reasonable mathematical statistical analysis method is put forward. The main contents of this paper are as follows: (1) for LED lamps and lanterns, the humidity and temperature stresses are used as the accelerated stress of the test at the same time, and the luminous flux attenuation is used as the failure criterion to detect 70% of the initial luminous flux, which effectively shortens the test time; (2) the reliability of LED lighting driving power supply is analyzed, the 3D model diagram of driving power supply is established, and the finite element analysis is carried out with simulation software, the temperature rise of electronic components in driving power supply is measured by thermocouple temperature measurement method, the simulation results are verified, and the measurement data are analyzed, and then the method of reducing the temperature rise of driving power supply is put forward. The reliability of LED driving power supply can be improved. (3) the luminous flux test data under two different stress levels are obtained by experiments, and the life distribution of the test samples is described by Weibull distribution. The test data are statistically analyzed by the least square method and the Arennis model. Finally, the life of lamps and lanterns under normal stress level is deduced. (4) the problems existing in the test and the uncertainty of the test results are analyzed, which provides a reasonable scheme and reliable data support for the life evaluation of LED lamps and lanterns in the future.
【學(xué)位授予單位】：廈門(mén)理工學(xué)院
【學(xué)位級(jí)別】：碩士
【學(xué)位授予年份】：2017
【分類號(hào)】：TM923.34

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本文編號(hào)：2507923