本文關鍵詞：多層瓷介電容器長期貯存壽命可靠性研究　出處：《哈爾濱工業(yè)大學》2016年碩士論文　論文類型：學位論文

  更多相關文章： 多層瓷介電容器 長期貯存 貯存壽命 加速退化試驗 線性回歸模型

【摘要】：本文分析了多層瓷介電容器的結構、工藝、材料,對多層瓷介電容器在應用中的可靠性隱患進行了深入研究,針對多層瓷介電容器的薄弱環(huán)節(jié)制定了改進措施,改進后的多層瓷介電容器屬于高可靠產(chǎn)品,只存在與溫度相關的退化失效模式。本文研究制定了高可靠多層瓷介電容器適用的基于偽失效閾值的加速退化壽命試驗方法,利用較短時間的常溫貯存數(shù)據(jù)確定偽失效閾值,對退化數(shù)據(jù)運用線性退化模型進行分析處理,得到了給定偽失效閾值條件下的偽失效壽命預計結果。為驗證預計結果的準確性,采用了威布爾分布的數(shù)據(jù)統(tǒng)計方法和灰色系統(tǒng)理論模型GM(1,1)分別對加速退化數(shù)據(jù)和常溫貯存數(shù)據(jù)進行了分析,結果表明本文提出的基于偽失效閾值的加速退化試驗方法的壽命預計結果與上述兩種方法一致,因此利用基于偽失效閾值的加速貯存退化試驗方法評價高可靠多層瓷介電容器的壽命是有效的、可行的。采用基于偽失效閾值的加速退化試驗方法可以獲取有限壽命范圍內(nèi)的參數(shù)退化情況,與通�；谑Ыy(tǒng)計的加速貯存壽命試驗相比,能夠縮短試驗時間,成本更低,更適合工程應用。論文的主要內(nèi)容包括以下幾個方面:(1)針對多層瓷介電容器的結構特點,對結構的薄弱環(huán)節(jié)進行了分析,通過總結導致多層瓷介電容器失效的原因,提出了工藝過程中的改進措施,對多層瓷介電容器進行貯存壽命評價的先決條件為多層瓷介電容器已經(jīng)消除了潛在失效模式,即多層瓷介電容器應為高可靠產(chǎn)品。(2)根據(jù)高可靠產(chǎn)品失效率低的特點,研究制定了基于阿倫尼斯模型的加速退化試驗方法,利用常溫貯存數(shù)據(jù)確定了偽失效閾值,對加速退化試驗數(shù)據(jù)進行線性回歸處理,得到在給定偽失效閾值的條件下的偽失效壽命預計結果。(3)通過建立反推關系模型,驗證了高溫試驗數(shù)據(jù)的準確性。采用威布爾壽命分布、灰色系統(tǒng)理論模型分別對高溫加速數(shù)據(jù)和常溫貯存數(shù)據(jù)進行分析,得到的壽命預計結果均與本文提出的基于偽失效閾值的加速退化試驗方法相一致。
[Abstract]:In this paper, the structure, process and material of multilayer ceramic capacitor are analyzed, and the hidden trouble of reliability in the application of multilayer ceramic capacitor is deeply studied, and the improvement measures are made for the weak link of multilayer ceramic dielectric capacitor. The improved multilayer ceramic dielectric capacitor belongs to a high reliability product. There are only degradation failure modes related to temperature. In this paper, an accelerated degradation life test method based on pseudo failure threshold for high reliability multilayer ceramic dielectric capacitors is developed. The pseudo failure threshold is determined by using the data stored at room temperature for a short time, and the degradation data is analyzed and processed by linear degradation model. The prediction results of pseudo-failure life under the given pseudo-failure threshold are obtained. In order to verify the accuracy of the predicted results, the Weibull distribution data statistics method and the grey system theory model GM(1 are adopted. 1) the accelerated degradation data and the storage data at room temperature are analyzed respectively. The results show that the life prediction results of the proposed accelerated degradation test method based on pseudo-failure threshold are consistent with those of the above two methods. Therefore, it is effective to use the accelerated storage degradation test method based on pseudo failure threshold to evaluate the life of high reliability multilayer ceramic dielectric capacitor. It is feasible to use the accelerated degradation test method based on pseudo failure threshold to obtain the parameter degradation in the limited life range, compared with the accelerated storage life test based on failure statistics. It can shorten the test time, lower cost, more suitable for engineering application. The main contents of this paper include the following aspects: 1) in view of the structural characteristics of multilayer ceramic dielectric capacitor, the weak links of the structure are analyzed. Through summing up the causes of the failure of the multilayer ceramic dielectric capacitor, the improvement measures in the process are put forward. The prerequisite for evaluating the storage life of multilayer ceramic dielectric capacitors is that the potential failure modes have been eliminated. That is, the multilayer ceramic dielectric capacitor should be a high reliability product. (2) according to the characteristics of low failure rate of high reliability products, the accelerated degradation test method based on Arrhenis model was developed. The pseudo failure threshold was determined by using the stored data at room temperature, and the accelerated degradation test data were treated by linear regression. The prediction results of pseudo-failure life under the condition of given pseudo-failure threshold are obtained. The accuracy of high-temperature test data is verified by establishing a model of backstepping relationship. Weibull life distribution is adopted. The theoretical model of grey system is used to analyze the accelerated data at high temperature and storage data at room temperature, and the results of life prediction are in agreement with the accelerated degradation test method based on pseudo-failure threshold proposed in this paper.
【學位授予單位】：哈爾濱工業(yè)大學
【學位級別】：碩士
【學位授予年份】：2016
【分類號】：TM53

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