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CMOS圖像傳感器溫度噪聲及去噪研究

發(fā)布時(shí)間:2018-12-07 09:32
【摘要】:近年來(lái),各種衛(wèi)星平臺(tái)和空間飛行系統(tǒng)都需要像感器來(lái)進(jìn)行信息數(shù)據(jù)的傳輸。隨著航天技術(shù)的普遍性,像感器在衛(wèi)星光通信系統(tǒng)中的作用愈發(fā)重要。由于半導(dǎo)體工藝逐漸成熟,CMOS像感器由于其集成度高、抗干擾能力強(qiáng)、能耗低、價(jià)格低、體積小等優(yōu)點(diǎn),獲得越來(lái)越高的關(guān)注。在航天領(lǐng)域中,人們對(duì)星載設(shè)備的質(zhì)量、尺寸、能耗等具有非常嚴(yán)格的要求,而CMOS像感器的諸多特性更加符合這一條件。而對(duì)于在空間環(huán)境工作的成像器件而言,復(fù)雜的空間外熱流環(huán)境以及衛(wèi)星平臺(tái)其他熱載荷的作用也是影響其性能的一個(gè)重要因素。光電器件的空間應(yīng)用可靠性直接關(guān)系衛(wèi)星與載荷的在軌性能與運(yùn)行壽命,目前很多科研小組將注意力放在CMOS像感器的核心器件光電二極管以及MOSFET等半導(dǎo)體器件的溫度效應(yīng)上,而對(duì)于CMOS像感器整體的溫度效應(yīng)研究并不多見(jiàn)。本論文針對(duì)以上問(wèn)題,主要完成以下幾方面的研究:總結(jié)了CMOS像感器溫度噪聲的研究意義和研究現(xiàn)狀,提出了研究CMOS像感器溫度噪聲必要性。結(jié)合光電二極管、MOSFET以及CMOS像感器的工作機(jī)理,闡述了溫度對(duì)CMOS像感器及其核心器件光電二極管和MOSFET的工作影響。以暗輸出灰度值變化規(guī)律為基礎(chǔ)建立均值去噪模型,以噪聲灰度分布為基礎(chǔ)建立灰度去噪模型。本文開(kāi)創(chuàng)性的研究環(huán)境溫度對(duì)CMOS圖像傳感系統(tǒng)而非某一半導(dǎo)體元件的影響,并圍繞該課題進(jìn)行了多次實(shí)驗(yàn)研究,取得了規(guī)律性的成果為以后在空間環(huán)境中工作的CMOS像感器的溫度效應(yīng)提出理論指導(dǎo)和實(shí)驗(yàn)根據(jù),進(jìn)而加強(qiáng)使用CMOS像感器的衛(wèi)星光通信終端的跟瞄精準(zhǔn)程度,為提出相應(yīng)的影響補(bǔ)償措施提供指導(dǎo),同時(shí)對(duì)利用溫度噪聲預(yù)估器件壽命也具有一定的參考價(jià)值。
[Abstract]:In recent years, all kinds of satellite platforms and space flight systems need image sensors to transmit information data. With the universality of space technology, image sensor plays an increasingly important role in satellite optical communication system. Due to the maturation of semiconductor technology, CMOS image sensor has gained more and more attention because of its advantages of high integration, strong anti-interference ability, low energy consumption, low price and small volume. In the field of spaceflight, people have strict requirements on the quality, size and energy consumption of spaceborne equipment, and many characteristics of CMOS image sensor are more suitable for this condition. For imaging devices operating in space environment, the complex outer heat flux environment and other thermal loads of satellite platform are also an important factor affecting its performance. The reliability of optoelectronic devices in space is directly related to the on-orbit performance and service life of satellites and payloads. At present, many scientific teams have focused their attention on the temperature effects of photodiodes, the core devices of CMOS image sensors, and semiconductor devices such as MOSFET. But the temperature effect of CMOS image sensor is rare. In order to solve the above problems, this paper mainly studies the following aspects: the research significance and research status of CMOS image sensor temperature noise are summarized, and the necessity of studying CMOS image sensor temperature noise is put forward. Combined with the working mechanism of photodiode, MOSFET and CMOS image sensor, the influence of temperature on the work of CMOS image sensor and its core device, photodiode and MOSFET is expounded. The mean denoising model is established on the basis of the variation rule of dark output gray value, and the gray scale denoising model is established based on the distribution of noise gray scale. In this paper, the effect of ambient temperature on CMOS image sensing system, not a semiconductor component, has been studied, and many experiments have been carried out around the subject. The regular results provide theoretical guidance and experimental basis for the temperature effect of the CMOS image sensors working in the space environment in the future, and further enhance the accuracy of tracking and pointing of the satellite optical communication terminals using the CMOS image sensors. It provides guidance for the corresponding influence compensation measures, and also has certain reference value for predicting the device life by using temperature noise.
【學(xué)位授予單位】:哈爾濱工業(yè)大學(xué)
【學(xué)位級(jí)別】:碩士
【學(xué)位授予年份】:2017
【分類號(hào)】:TP212

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