本文關(guān)鍵詞： 物理不可克隆函數(shù) 噪聲節(jié)點 真隨機種子 高效率　出處：《電子與信息學報》2017年06期 　論文類型：期刊論文

【摘要】：該文設(shè)計了一種基于SRAM物理不可克隆函數(shù)(PUFs)的高效真隨機種子發(fā)生器。通過將不提供熵值的穩(wěn)定節(jié)點和提供低熵值的噪聲節(jié)點篩除,只選用能夠提供較高熵值的噪聲節(jié)點來生成滿熵種子,大幅降低需要處理的數(shù)據(jù)量,提高節(jié)點數(shù)據(jù)的處理效率。通過測試SRAM PUFs內(nèi)部噪聲節(jié)點的振蕩特性,提出篩選出SRAM PUFs內(nèi)部高熵值的噪聲節(jié)點的最佳策略,最終基于此策略設(shè)計出真隨機種子發(fā)生器。該設(shè)計可以產(chǎn)生128~256 bit長度的滿熵的種子且處理的節(jié)點數(shù)據(jù)量只有當前方法的0.5%~4%。生成的種子滿足NIST架構(gòu)的隨機數(shù)生成器要求,產(chǎn)生的偽隨機數(shù)全部通過了隨機數(shù)檢測。與現(xiàn)有設(shè)計相比,該文提出的真隨機種子發(fā)生器是一種高效的、適用范圍較廣的設(shè)計。
[Abstract]:In this paper, an efficient true random seed generator based on SRAM physical nonclonal function (PUFs) is designed, which removes the stable nodes without entropy and the noise nodes with low entropy. Only the noise nodes which can provide high entropy value are used to generate full entropy seeds, which greatly reduce the amount of data to be processed. By testing the oscillation characteristics of SRAM PUFs internal noise nodes, the optimal strategy of selecting the noise nodes with high entropy value in SRAM PUFs is put forward. Finally, a true random seed generator is designed based on this strategy. The full entropy seed of bit length and the amount of node data processed are only 0.5% of the current method. The generated seeds meet the requirements of the random number generator of the NIST architecture. All the pseudo-random numbers are tested by random number. Compared with the existing design, the true random seed generator presented in this paper is an efficient and widely used design.
【作者單位】： 東南大學集成電路學院;深圳大學信息工程學院;
【基金】：國家自然科學基金(61571116)~~
【分類號】：TN402;TN918
【正文快照】： 1引言在當今社會,信息安全的問題日益被人們關(guān)注。物理不可克隆函數(shù)(Physical Unclonable Functions,PUFs)[1]作為其中重要的組成部分,被越來越多的研究者所研究。SRAM PUFs因其擁有設(shè)計簡單、經(jīng)濟性好、可靠性較高[2]等特點而廣受青睞。無論是身份認證[3,4]、隨機數(shù)產(chǎn)生[5]還，

本文編號：1449188