本文選題：金屬 + 線脹系數(shù)��； 參考：《大學物理》2017年01期

【摘要】：為提高金屬線脹系數(shù)的測量精度和靈敏度,以方便數(shù)字化測量與微機處理,以PSD光電傳感器為核心實現(xiàn)微位移測量,采用光學放大機構(gòu)提高微位移分辨率,利用BOS-PSD0018芯片實現(xiàn)微位移轉(zhuǎn)換,并用單片機系統(tǒng)實現(xiàn)金屬線脹系數(shù)的數(shù)字化處理與顯示.用銅棒進行了標定測試,用鐵棒進行檢測試驗,檢測試驗表明金屬線脹系數(shù)最大相對誤差為±2.3%,用光學放大機構(gòu)使微位移分辨率比提高4倍.
[Abstract]:In order to improve the measuring accuracy and sensitivity of metal linear expansion coefficient, the micro displacement measurement is realized with PSD photoelectric sensor as the core, and the resolution of micro displacement is improved by optical amplification mechanism. The BOS-PSD0018 chip is used to realize the micro-displacement conversion, and the single-chip microcomputer system is used to realize the digital processing and display of the metal linear expansion coefficient. The calibration test with copper rod and the test with iron bar show that the maximum relative error of linear expansion coefficient of metal is 鹵2.3, and the resolution ratio of micro-displacement is increased 4 times by optical amplification mechanism.
【作者單位】： 湖南科技學院電子與信息工程學院;
【基金】：2013年湖南省科技廳科技計劃項目(2013NK3026) 湖南科技學院“電路與系統(tǒng)”重點學科建設項目資助
【分類號】：O551.3-34
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本文編號：1944605