本文選題：均值標(biāo)準(zhǔn)差曲線描述子 + 曲線匹配　； 參考：《電子學(xué)報(bào)》2017年07期

【摘要】：針對(duì)反射對(duì)稱軸難以檢測(cè)的問(wèn)題,該文提出一種基于改進(jìn)均值標(biāo)準(zhǔn)差曲線描述子(Mean-Standard deviation Curve Descriptor,MSCD)的反射對(duì)稱軸檢測(cè)算法.該算法首先對(duì)MSCD曲線描述子進(jìn)行改進(jìn),使其具有鏡像反射不變性并實(shí)現(xiàn)對(duì)稱曲線對(duì)檢測(cè);然后采用距離約束并使用Hough變換獲取圖像的局部對(duì)稱軸;最后通過(guò)局部對(duì)稱軸合并得到最終對(duì)稱軸.實(shí)驗(yàn)結(jié)果表明,該算法可實(shí)現(xiàn)圖像的單對(duì)稱軸和多對(duì)稱軸檢測(cè),在亮度變化、對(duì)比度變化、噪聲污染、模糊以及形變情況下,均能夠準(zhǔn)確定位圖像對(duì)稱軸并具有較強(qiáng)魯棒性.
[Abstract]:Aiming at the problem that the reflection symmetry axis is difficult to detect, this paper presents an algorithm for detecting the reflection symmetry axis based on the improved mean standard deviation curve descriptor (Mean-Standard deviation Curve). Firstly, the MSCD curve descriptor is improved to be mirror reflection invariant and the symmetric curve pair is detected, then the local symmetry axis of the image is obtained by distance constraint and Hough transform. Finally, the final symmetry axis is obtained by merging the local symmetry axis. The experimental results show that the algorithm can detect the single symmetry axis and the multiple symmetry axis of the image. The algorithm can accurately locate the symmetry axis of the image under the condition of brightness change, contrast change, noise pollution, blur and deformation, and has strong robustness.
【作者單位】： 河南理工大學(xué)計(jì)算機(jī)科學(xué)與技術(shù)學(xué)院;西安電子科技大學(xué)計(jì)算機(jī)學(xué)院;
【基金】：國(guó)家自然科學(xué)基金(No.61272394,No.61472119,No.61572173,No.61472373,No.61401150) 河南理工大學(xué)創(chuàng)新型科研團(tuán)隊(duì)項(xiàng)目(No.T014-3);河南理工大學(xué)杰出青年基金(No.J2016-3) 河南省高�；究蒲袠I(yè)務(wù)費(fèi)(No.NSFRF1604)
【分類號(hào)】：TP391.41

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