In present work, diamond/β-SiC composite interlayers were deposited on cemented tungsten carbide（WC-6%Co） substrates by microwave plasma enhanced chemical vapor deposition（MPCVD） using H₂,CH₄ and tetramethylsilane（TMS） gas mixtures. The microstructure, chemical bonding, element distribution and crystalline quality of the composite interlayers were systematically characterized by means of field-emission scanning electron microscopy（FE-SEM）, X-ray diffraction（XRD）, X-ray phot... 

【文章來源】：Journal of Materials Science & Technology. 2017,33(10)

【文章頁數(shù)】：10 頁


本文編號：2959123