【摘要】：為滿足大量U-Zr合金常規(guī)分析的需求,研究了用能量色散X射線熒光光譜(EDXRF)法測(cè)定U-Zr合金中Zr的含量。切屑樣品經(jīng)溶解、轉(zhuǎn)移、烘干等操作后,制備出薄層樣品,用于EDXRF測(cè)量。與傳統(tǒng)方法相比,本方法簡(jiǎn)便、快速、準(zhǔn)確,適用于Zr含量在6%~18%(質(zhì)量分?jǐn)?shù),下同)范圍的U-Zr合金樣品的Zr含量測(cè)定,測(cè)量結(jié)果的相對(duì)標(biāo)準(zhǔn)偏差(n=6)不大于1.0%,方法擴(kuò)展不確定度(k=2)不大于3%。
[Abstract]:In order to meet the needs of conventional analysis of a large number of U-Zr alloys, the content of Zr in U-Zr alloys was determined by energy dispersive X-ray fluorescence spectroscopy (EDXRF). After dissolution, transfer and drying of chip samples, thin layer samples were prepared and used for EDXRF measurement. Compared with the traditional method, this method is simple, rapid and accurate, and is suitable for the determination of Zr content in U-Zr alloy samples with Zr content in the range of 6% 鈮，

本文編號(hào)：2495377