硫系玻璃基底高強減反膜制備工藝技術研究
[Abstract]:Sulfur glass is a new kind of infrared optical material. It is a good window material for infrared optical system because of its wide infrared transmission band, low temperature coefficient of refractive index and precision molding. It is helpful for the further popularization and application of sulfur glasses to explore the coating characteristics and the preparation technology of high strength antireflection film. In this paper, the material properties of the preparation process of sulfur-based glass substrates (IRG205,IRG206) are studied experimentally, and the ion-assisted bombardment intensity and time of the substrates are determined. On this basis, the preparation technology of 8 ~ 12 渭 m high strength antireflection film on sulfur glass substrate (IRG205,IRG206) was investigated. In view of the characteristics of low softening point of sulfur glass substrates (IRG205,IRG206), the preparation process and characteristics of DLC thin films deposited by PECVD technique at low temperature were studied. The feasibility of low temperature deposition of high strength antireflection films on IRG205,IRG206 substrates was discussed. Finally, the infrared high strength antireflection film was prepared on the sulfur glass substrate (IRG205,IRG206) by combined deposition technology. The results show that: (1) the resistance of sulfur glass substrate to auxiliary ion bombardment is relatively weak, and its bombardment intensity and time need to be strictly controlled. (2) it is feasible to deposit DLC on IRG205,IRG206 substrate at room temperature by using PECVD technique. When the thickness of the film is less than that of 200nm, it is feasible to deposit DLC on the glass substrate (IRG205,IRG206) at room temperature. (3) it is not advisable to use the PECVD technique to deposit 8 ~ 12 渭 m dielectric optical thin films. The prepared thin films have a strong absorption peak in this band. (4) it is feasible to prepare 812 渭 m high strength antireflection films by using PVD to prepare high performance antireflection films and PECVD to prepare DLC on sulfur glass substrates (IRG205,IRG206). The average transmittance of the film is more than 90. The antiwear strength and environmental test of the film meet the requirements of JB/T8226.1-1999 standard.
【學位授予單位】:西安工業(yè)大學
【學位級別】:碩士
【學位授予年份】:2017
【分類號】:TB383.2;TQ171.7
【參考文獻】
相關期刊論文 前10條
1 魏曉麗;張玲;陳廈平;王輔明;;含氫DLC膜的疏水性研究[J];表面技術;2016年05期
2 安書董;王曉燕;陳仙;王炎武;趙玉清;;離子束轟擊改性對基底表面織構形成規(guī)律的影響研究[J];真空科學與技術學報;2015年03期
3 楊永亮;岳莉;李娜;唐昊龍;;Rf-PECVD制備Si摻雜DLC薄膜性能的研究[J];激光與光電子學進展;2015年01期
4 付秀華;楊金也;劉冬梅;張靜;寇洋;;基于8~11μm紅外窗口系統(tǒng)中減反射與保護膜的研制[J];紅外與激光工程;2014年12期
5 楊玉衛(wèi);張華;楊堅;古宏偉;;射頻功率對紅外光學用類金剛石膜結構和性能的影響[J];紅外技術;2014年11期
6 蘆雅靜;宋寶安;董偉;徐鐵峰;戴世勛;聶秋華;沈祥;林常規(guī);;硫系玻璃在汽車夜視系統(tǒng)中的應用[J];紅外與激光工程;2014年09期
7 胡九龍;杭凌俠;周順;;PECVD技術制備低折射率光學薄膜[J];表面技術;2013年02期
8 韓亮;寧濤;劉德連;何亮;;氬離子轟擊對四面體非晶碳膜內應力和摩擦系數影響的研究[J];物理學報;2012年17期
9 戴世勛;陳惠廣;李茂忠;姜杰;徐鐵峰;聶秋華;;硫系玻璃及其在紅外光學系統(tǒng)中的應用[J];紅外與激光工程;2012年04期
10 堅增運;曾召;董廣志;常芳娥;何壇;陳極;;硫系紅外玻璃的研究進展[J];西安工業(yè)大學學報;2011年01期
相關會議論文 前1條
1 吳小麗;熊長新;李錢陶;何光宗;;ZnS基底紅外雙波段保護膜研究[A];中國光學學會2010年光學大會論文集[C];2010年
相關碩士學位論文 前4條
1 薛俊;PECVD制備光學薄膜折射率控制技術研究[D];西安工業(yè)大學;2014年
2 陳林林;類金剛石薄膜制備工藝與特性研究[D];中國科學院研究生院(光電技術研究所);2013年
3 潘德芳;PECVD制備DLC薄膜的表面形貌和光學特性研究[D];重慶師范大學;2011年
4 張霄;PEVCD技術制作減反膜研究[D];西安工業(yè)大學;2010年
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