基于SRAM型FPGA的數(shù)字系統(tǒng)容錯(cuò)機(jī)制研究
本文選題:容錯(cuò) 切入點(diǎn):自修復(fù) 出處:《南京航空航天大學(xué)》2016年碩士論文
【摘要】:空天應(yīng)用中基于SRAM型現(xiàn)場(chǎng)可編程門陣列(Field Programmable Gate Array,FPGA)的電子系統(tǒng)易因輻射誘發(fā)各種軟故障和硬故障,故為保證任務(wù)的順利完成,系統(tǒng)必須具有較強(qiáng)的容錯(cuò)能力。目前大部分系統(tǒng)容錯(cuò)的研究工作側(cè)重于處理某一類故障,能同時(shí)處理軟故障和硬故障的研究成果較少。本文將三模冗余(Triple Modular Redundancy,TMR)、部分配置刷新和演化硬件(Evolvable Hardware,EHW)思想相結(jié)合,設(shè)計(jì)具有在線自修復(fù)能力的單芯片強(qiáng)容錯(cuò)數(shù)字系統(tǒng)結(jié)構(gòu)和故障修復(fù)機(jī)制,對(duì)軟故障和硬故障均有較好的處理能力。本文主要研究?jī)?nèi)容如下:(1)分析了空天應(yīng)用環(huán)境下SRAM型FPGA常見的故障類型,并通過分析目前FPGA常用容錯(cuò)技術(shù)的優(yōu)缺點(diǎn)確定了本文的技術(shù)方案。介紹了Xilinx Virtex-6 ML605開發(fā)套件及其軟件開發(fā)環(huán)境概況。(2)將動(dòng)態(tài)部分重構(gòu)(Dynamic Partial Reconfiguration,DPR)技術(shù)和配置刷新技術(shù)相結(jié)合,設(shè)計(jì)了基于部分配置刷新的自主修復(fù)系統(tǒng),包括功能單元的預(yù)設(shè)計(jì)、片上可編程系統(tǒng)硬件平臺(tái)搭建、系統(tǒng)軟件設(shè)計(jì)、DPR設(shè)計(jì)、可配置刷新IP核定制。并通過實(shí)驗(yàn)驗(yàn)證了部分配置刷新技術(shù)對(duì)軟故障處理的有效性。(3)設(shè)計(jì)了基于虛擬可重構(gòu)電路(Virtual Reconfigurable Circuit,VRC)的自演化修復(fù)系統(tǒng),包括VRC電路設(shè)計(jì)、可演化IP核定制和添加、系統(tǒng)硬件平臺(tái)搭建、系統(tǒng)軟件設(shè)計(jì)。并以2位乘法器為例在ML605開發(fā)套件對(duì)自演化修復(fù)系統(tǒng)進(jìn)行了驗(yàn)證。(4)設(shè)計(jì)了基于SRAM型FPGA的容錯(cuò)系統(tǒng)總體結(jié)構(gòu),給出了系統(tǒng)的故障修復(fù)機(jī)制。設(shè)計(jì)了系統(tǒng)軟件,包括軟件整體架構(gòu)、軟故障的部分配置刷新修復(fù)控制、硬故障的演化修復(fù)控制。在ML605開發(fā)套件上,分別以2位乘法器和Sobel邊緣檢測(cè)器的設(shè)計(jì)和實(shí)現(xiàn)為例,通過模擬故障注入的方式,驗(yàn)證了系統(tǒng)結(jié)構(gòu)和故障修復(fù)機(jī)制。其中軟故障均使用配置刷新技術(shù)修復(fù),2位乘法器和Sobel邊緣檢測(cè)器的硬故障分別使用門級(jí)演化和函數(shù)級(jí)演化方式修復(fù)。實(shí)驗(yàn)結(jié)果表明,本文系統(tǒng)對(duì)兩類故障均具有較好的處理能力。
[Abstract]:The electronic system based on SRAM Field Programmable Gate FPGA in space-space application is prone to various soft and hard faults caused by radiation, so to ensure the smooth completion of the task, Systems must have a strong fault tolerance capability. At present, most of the research work on fault tolerance in systems is focused on dealing with certain types of faults. There are few research results that can deal with both soft and hard faults. In this paper, the idea of triple Modular redundancy, partial configuration refresh and Evolvable hardware EHW are combined. A single chip strong fault-tolerant digital system structure and fault repair mechanism with on-line self-repair capability are designed. The main contents of this paper are as follows: (1) the common fault types of SRAM type FPGA in space-space application environment are analyzed. By analyzing the advantages and disadvantages of the common fault-tolerant technologies in FPGA, this paper determines the technical scheme of this paper, and introduces the Xilinx Virtex-6 ML605 development suite and its software development environment, which combines the dynamic Partial Reconfiguration with the configuration refresh technology. A self-repairing system based on partial configuration refresh is designed, including pre-design of function unit, hardware platform of on-chip programmable system, system software design and DPR design. The validity of partial configuration refresh technology for soft fault processing is verified by experiments. A self-evolving repair system based on virtual reconfigurable circuit virtual Reconfigurable circuit is designed, including the design of VRC circuit. The architecture of fault-tolerant system based on SRAM type FPGA is designed with the example of 2-bit multiplier in ML605 development suite to verify the self-evolution repair system. This paper presents the fault repair mechanism of the system, designs the system software, including the whole software architecture, the soft fault partial configuration refresh repair control, the hard fault evolution repair control. Taking the design and implementation of 2-bit multiplier and Sobel edge detector as examples, the fault injection is simulated. The system structure and fault repair mechanism are verified, in which soft faults are repaired by configuration refresh technique for 2-bit multiplier and Sobel edge detector by gate level evolution and function level evolution respectively. The experimental results show that, The system has better ability to deal with both kinds of faults.
【學(xué)位授予單位】:南京航空航天大學(xué)
【學(xué)位級(jí)別】:碩士
【學(xué)位授予年份】:2016
【分類號(hào)】:V446
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