光伏型紅外TDI陣列碲鎘汞探測器的串擾機制研究
發(fā)布時間：2018-11-08 16:09
【摘要】：在紅外成像系統(tǒng)中,串擾會降低圖像質量,因此對串擾的測試及產生機理等研究至關重要。論文以新一代紅外TDI陣列碲鎘汞探測器作為研究對象,從實驗和理論兩個方面,系統(tǒng)研究了光致串擾的產生機制,研究結果具有前沿性和重要的學術價值。論文首先從理論上對比研究了陣列型探測器件串擾效應的兩種產生機理、三種測試原理和測試方法,分別從光的反射、折射、散射、目標光點的衍射和光學系統(tǒng)的像差五個方面系統(tǒng)揭示了光學串擾的產生機理;從載流子特征參數(shù)、載流子的輻射復合、表面溝道、光敏元和處理電路設計五個方面系統(tǒng)揭示了電學串擾的產生機理;從器件的結構設計、工藝提升、算法優(yōu)化三個方面詳細地闡明了光學串擾的解決方案;從結構設計、工藝提升和電路技術三個方面詳細地闡明了電學串擾的解決方案。在上述研究的基礎上,針對紅外TDI陣列碲鎘汞探測器,分別研究了波段內和峰值響應波段外光致串擾的產生機制,揭示了該類器件光致串擾大小與入射光波長、入射光功率密度、入射光體制(連續(xù)和脈沖)的關系以及同一輻照通道各個探測單元間與不同通道各個探測單元間的串擾特性。主要研究結論如下:1.實驗發(fā)現(xiàn),當入射光功率密度達到一定程度時,無論是3800 nm波段內的連續(xù)光還是1064 nm峰值響應波段外的連續(xù)光,TDI探測器同一輻照通道各個探測單元間、不同通道各個探測單元間均會出現(xiàn)串擾,串擾程度均隨入射光功率密度的增加而增大,最終探測單元可全部達到飽和;但當入射光功率密度相同時,波段內探測器的串擾程度大于峰值響應波段外的。2.當波段內連續(xù)入射光功率密度在3.0 W/cm~2~9.8×10~2 W/cm~2范圍時,輻照通道串擾單元數(shù)N與入射激光功率密度P的雙對數(shù)坐標曲線存在近似線性關系,且該曲線的斜率為0.36;未被輻照通道串擾單元數(shù)N與入射激光功率密度P的雙對數(shù)坐標也存在近似線性關系,且該曲線的斜率為0.46。研究表明,由高階衍射效應引起的光學串擾是同一輻照通道各個探測單元間串擾的主要來源,而不同通道各個探測單元間串擾的主要來源則是由于載流子的運動所引發(fā)的電學串擾。3.與波段內電壓響應輸出結果類似,當峰值響應波段外連續(xù)入射光功率密度在0.8 W/cm~2~1.9×10~2 W/cm~2范圍時,輻照通道串擾單元數(shù)N與入射激光功率密度P的雙對數(shù)坐標曲線存在近似線性關系,且該曲線的斜率為0.39;未輻照通道串擾單元數(shù)N與入射激光功率密度P的雙對數(shù)坐標也存在近似線性關系,且該曲線的斜率為0.51。研究表明,由高階衍射效應引起的光學串擾是同一輻照通道各個探測單元間串擾的主要來源;不同通道各個探測單元間串擾的主要來源則是由于載流子的運動所引發(fā)的電學串擾。4.實驗發(fā)現(xiàn),當?shù)椭仡l脈沖光輻照TDI陣列碲鎘汞探測器時,探測器出現(xiàn)了不同于連續(xù)光的對稱分布響應新現(xiàn)象,即電壓響應輸出曲線存在一個對稱中心,以該中心為軸,響應曲線左右兩邊的輸出電壓呈180度鏡像的對稱分布。研究表明低重頻脈沖激光導致入射光時刻與探測器積分周期失配產生對稱響應分布。
[Abstract]:In the infrared imaging system, the crosstalk can reduce the image quality, so it is very important to study the test of the crosstalk and the mechanism of the generation. In this paper, a new generation of infrared TDI array is used as the research object, and from the two aspects of the experiment and the theory, the mechanism of the light-induced crosstalk is studied, and the research results have the leading edge and the important academic value. In this paper, the two generation mechanisms, three test principles and test methods of the crosstalk effect of the array-type detector are studied theoretically, and the reflection, refraction and scattering of the light are respectively calculated from the light reflection, refraction and scattering. The system of the five aspects of the diffraction of the target spot and the aberration of the optical system reveals the mechanism of the generation of the optical crosstalk, and the generation mechanism of the disturbance of the electrical string is revealed from the carrier characteristic parameters, the radiation recombination of the carriers, the surface channel, the photosensitive element and the processing circuit design. The solution of optical crosstalk is described in detail from the three aspects of structure design, process improvement and algorithm optimization of the device, and the solution of electrical crosstalk is explained in detail from the three aspects of structural design, process improvement and circuit technology. On the basis of the above-mentioned research, the generation mechanism of the external light-induced crosstalk in the band and the peak-response band is studied for the infrared TDI array, and the magnitude of the light-induced crosstalk of the device and the incident light wavelength and the power density of the incident light are disclosed. The relationship between the incident light system (continuous and pulse) and the crosstalk characteristics between the individual detection units of the same irradiation channel and each of the detection units of different channels. The main findings are as follows: 1. The experiment shows that, when the power density of the incident light reaches a certain degree, the continuous light in the 3800 nm wavelength band or the continuous light outside the 1064nm peak response band, the TDI detector is in the same irradiation channel, the degree of crosstalk increases with the increase of the power density of the incident light, and the final detection unit can all reach saturation; however, when the power density of the incident light is the same, the crosstalk degree of the detector in the wave band is larger than that of the peak-response band. When the power density of the continuous incident light in the wave band is in the range of 3.0 W/ cm ~ 2 ~ 9. 8 and 10 ~ 2 W/ cm ~ 2, there is an approximate linear relationship between the number N of the irradiation channel and the double log curve of the incident laser power density P, and the slope of the curve is 0. 36; There is also an approximate linear relationship between the number of unirradiated channel crosstalk units N and the double logarithmic coordinates of the incident laser power density P, and the slope of the curve is 0.46. The results show that the optical crosstalk caused by the high order diffraction effect is the main source of the crosstalk among the detection units of the same irradiation channel, and the main source of the crosstalk among the various detection units of different channels is the electrical crosstalk caused by the movement of the carriers. Similar to the output of the voltage response in the band, when the power density of the continuous incident light in the peak-response band is in the range of 0.8 W/ cm-2-1. 9 and 10-2 W/ cm-2, there is an approximate linear relationship between the number N of the radiation channel crosstalk cell and the double log-log curve of the incident laser power density P, and the slope of the curve is 0.39; There is also an approximate linear relationship between the number N of the unirradiated channel and the double logarithmic coordinates of the incident laser power density P, and the slope of the curve is 0.51. The results show that the optical crosstalk caused by the high order diffraction effect is the main source of the crosstalk among the detection units of the same irradiation channel, and the main source of the crosstalk among the various detection units in different channels is the electrical crosstalk caused by the movement of the carriers. The experimental results show that the detector has a symmetrical distribution response to the continuous light when the low-heavy-frequency pulsed light is irradiated with the mercury detector of the TDI array, that is, there is a center of symmetry in the voltage response output curve, and the center is the axis. The output voltage on the left and right sides of the response curve is distributed at a symmetrical distribution of 180 degrees. The results show that the low-re-pulse laser causes a symmetrical response distribution to the mismatch of the incident light time and the detector integration period.
【學位授予單位】：國防科學技術大學
【學位級別】：碩士
【學位授予年份】：2015
【分類號】：TN215
本文編號：2318994
[Abstract]:In the infrared imaging system, the crosstalk can reduce the image quality, so it is very important to study the test of the crosstalk and the mechanism of the generation. In this paper, a new generation of infrared TDI array is used as the research object, and from the two aspects of the experiment and the theory, the mechanism of the light-induced crosstalk is studied, and the research results have the leading edge and the important academic value. In this paper, the two generation mechanisms, three test principles and test methods of the crosstalk effect of the array-type detector are studied theoretically, and the reflection, refraction and scattering of the light are respectively calculated from the light reflection, refraction and scattering. The system of the five aspects of the diffraction of the target spot and the aberration of the optical system reveals the mechanism of the generation of the optical crosstalk, and the generation mechanism of the disturbance of the electrical string is revealed from the carrier characteristic parameters, the radiation recombination of the carriers, the surface channel, the photosensitive element and the processing circuit design. The solution of optical crosstalk is described in detail from the three aspects of structure design, process improvement and algorithm optimization of the device, and the solution of electrical crosstalk is explained in detail from the three aspects of structural design, process improvement and circuit technology. On the basis of the above-mentioned research, the generation mechanism of the external light-induced crosstalk in the band and the peak-response band is studied for the infrared TDI array, and the magnitude of the light-induced crosstalk of the device and the incident light wavelength and the power density of the incident light are disclosed. The relationship between the incident light system (continuous and pulse) and the crosstalk characteristics between the individual detection units of the same irradiation channel and each of the detection units of different channels. The main findings are as follows: 1. The experiment shows that, when the power density of the incident light reaches a certain degree, the continuous light in the 3800 nm wavelength band or the continuous light outside the 1064nm peak response band, the TDI detector is in the same irradiation channel, the degree of crosstalk increases with the increase of the power density of the incident light, and the final detection unit can all reach saturation; however, when the power density of the incident light is the same, the crosstalk degree of the detector in the wave band is larger than that of the peak-response band. When the power density of the continuous incident light in the wave band is in the range of 3.0 W/ cm ~ 2 ~ 9. 8 and 10 ~ 2 W/ cm ~ 2, there is an approximate linear relationship between the number N of the irradiation channel and the double log curve of the incident laser power density P, and the slope of the curve is 0. 36; There is also an approximate linear relationship between the number of unirradiated channel crosstalk units N and the double logarithmic coordinates of the incident laser power density P, and the slope of the curve is 0.46. The results show that the optical crosstalk caused by the high order diffraction effect is the main source of the crosstalk among the detection units of the same irradiation channel, and the main source of the crosstalk among the various detection units of different channels is the electrical crosstalk caused by the movement of the carriers. Similar to the output of the voltage response in the band, when the power density of the continuous incident light in the peak-response band is in the range of 0.8 W/ cm-2-1. 9 and 10-2 W/ cm-2, there is an approximate linear relationship between the number N of the radiation channel crosstalk cell and the double log-log curve of the incident laser power density P, and the slope of the curve is 0.39; There is also an approximate linear relationship between the number N of the unirradiated channel and the double logarithmic coordinates of the incident laser power density P, and the slope of the curve is 0.51. The results show that the optical crosstalk caused by the high order diffraction effect is the main source of the crosstalk among the detection units of the same irradiation channel, and the main source of the crosstalk among the various detection units in different channels is the electrical crosstalk caused by the movement of the carriers. The experimental results show that the detector has a symmetrical distribution response to the continuous light when the low-heavy-frequency pulsed light is irradiated with the mercury detector of the TDI array, that is, there is a center of symmetry in the voltage response output curve, and the center is the axis. The output voltage on the left and right sides of the response curve is distributed at a symmetrical distribution of 180 degrees. The results show that the low-re-pulse laser causes a symmetrical response distribution to the mismatch of the incident light time and the detector integration period.
【學位授予單位】：國防科學技術大學
【學位級別】：碩士
【學位授予年份】：2015
【分類號】：TN215
【參考文獻】
相關期刊論文 前10條
1 李曉龍;趙威;張雷雷;張啟鵬;康華超;劉偉;;1.06μm脈沖激光對TDI-CCD的干擾實驗研究[J];激光技術;2015年03期
2 康文運;危峻;宋小全;王禹;;激光對推掃相機的干擾[J];紅外與毫米波學報;2014年06期
3 陶東興;賈國瑞;趙慧潔;袁艷;馬艷華;;推掃型高光譜數(shù)據(jù)光串擾校正方法研究[J];光譜學與光譜分析;2014年11期
4 汪洋;劉大福;徐勤飛;范廣宇;龔海梅;;紅外光導探測器組件的串音研究[J];紅外;2014年07期
5 朱辰;李堯;王雄飛;張昆;熊文龍;張浩彬;張大勇;張利明;;超連續(xù)譜光源對CMOS圖像傳感器的干擾實驗研究[J];激光與紅外;2014年04期
6 徐超;姚素英;徐江濤;高志遠;韓立鏹;;A dynamic range extension scheme applied to a TDI CMOS image sensor[J];Journal of Semiconductors;2014年02期
7 陳敏聰;;線陣列探測器串擾試驗[J];無損檢測;2014年02期
8 王憶鋒;馬鈺;;論紅外焦平面器件的串音[J];紅外;2014年01期
9 徐江濤;孫羽;徐超;姚素英;;背照式像素電學串擾及其抑制[J];中國科技論文;2013年10期
10 高岑;姚素英;高靜;;一種適用于16級TDI CMOS圖像傳感器的電流型累加器(英文)[J];南開大學學報(自然科學版);2013年04期
相關博士學位論文 前1條
1 張震;可見光CCD的激光致眩現(xiàn)象與機理研究[D];國防科學技術大學;2010年
相關碩士學位論文 前4條
1 王勝男;平臺運動誤差對TDI成像質量影響的研究[D];南京理工大學;2013年
2 邱偉成;線陣光伏型碲鎘汞探測器激光輻照效應若干問題研究[D];國防科學技術大學;2012年
3 王廣然;考慮工藝波動的納米級CMOS互連延時和串擾分析[D];西安電子科技大學;2012年
4 楊磊;激光輻照HgCdTe紅外探測器的研究[D];電子科技大學;2008年
，本文編號：2318994
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