基于驅(qū)動時序的CCD曝光時間控制技術(shù)研究
[Abstract]:In recent years, with the development of imaging spectral remote sensing technology, spectral imaging technology plays a more and more important role. The development of spectral remote sensing technology depends on the progress of various technologies. CCD (charge coupled device) because of its high sensitivity, Many advantages, such as low noise and large dynamic range, have become the core devices in the field of spectral imaging. Four factors affecting the brightness of the image, such as aperture size, intensity of incident light, exposure time and signal gain, are the best choice. However, for the frame transfer CCD imaging device without the electronic shutter function, when the frame frequency is determined, the exposure time can not be controlled is the technical bottleneck of using this kind of CCD detector at present. For the CCD detector without electron shutter, two kinds of exposure time control methods are proposed in this paper: level setting method and charge releasing method. The level setting method is implemented by setting all the signals in the photosensitive zone to the same zero level for a period of time. Charge release method can effectively control the exposure time by increasing the state of charge release and rapidly discharging the charge from the extra time period within a frame. Two exposure time control methods are implemented based on two different CCD detectors, TH7888A and CCD**, respectively. Firstly, the realization of two exposure time control methods is introduced, including CCD hardware driver circuit and driver timing logic design. In terms of hardware, a reasonable schematic design scheme is given. In the aspect of timing logic design, all kinds of driving timing signals of CCD are realized by VHDL language, and the simulation results are given. Secondly, under the condition of laboratory, by building a concrete test platform and based on the method proposed in this paper, the test waveform and image are collected under different exposure time, and the further analysis of the test results is made. The feasibility and correctness of the proposed method are verified.
【學(xué)位授予單位】:中國科學(xué)院研究生院(西安光學(xué)精密機(jī)械研究所)
【學(xué)位級別】:碩士
【學(xué)位授予年份】:2015
【分類號】:TN386.5
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