【摘要】：分析了典型光電倍增管的電子束聚焦過(guò)程和射頻電磁場(chǎng)對(duì)其干擾的機(jī)理,在此基礎(chǔ)上利用脈沖光源和TEM小室設(shè)計(jì)了一套實(shí)驗(yàn)裝置,開(kāi)展了光電倍增管電磁輻射敏感性研究。在實(shí)驗(yàn)中通過(guò)觀(guān)察光電倍增管計(jì)數(shù)率的變化,確定了其存在一個(gè)最敏感的干擾角度,找出了在此敏感角度下的干擾閾值和最易受干擾的頻率點(diǎn)。最后對(duì)光電倍增管的兩種電磁屏蔽措施進(jìn)行了對(duì)比,給出了一種較為滿(mǎn)意的設(shè)計(jì)方案,并應(yīng)用于某型β射線(xiàn)探測(cè)器。
[Abstract]:The focusing process of electron beam of typical photomultiplier tube and the interference mechanism of RF electromagnetic field are analyzed. On the basis of this, a set of experimental device is designed by using pulse light source and TEM cell, and the electromagnetic radiation sensitivity of photomultiplier tube is studied. By observing the change of the counting rate of photomultiplier tube, the most sensitive interference angle is determined, and the interference threshold and frequency point under the sensitive angle are found out. Finally, two kinds of electromagnetic shielding measures of photomultiplier tube are compared, and a satisfactory design scheme is given, which is applied to a certain type of 尾 -ray detector.
【作者單位】： 白城市職業(yè)技術(shù)學(xué)院;中國(guó)人民解放軍防化研究院;
【分類(lèi)號(hào)】：TN152
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本文編號(hào)：2145981