發(fā)布時(shí)間：2018-05-05 00:37

  本文選題：虛擬儀器 + 微波測(cè)量　； 參考：《國防科學(xué)技術(shù)大學(xué)》2015年碩士論文

【摘要】：微波測(cè)量技術(shù)是電磁場(chǎng)與微波技術(shù)領(lǐng)域的一個(gè)重要組成部分,無論在軍用領(lǐng)域還是民用領(lǐng)域都有著極為廣泛的應(yīng)用。傳統(tǒng)意義上的微波測(cè)量主要指的是信號(hào)特性參數(shù)測(cè)量以及網(wǎng)絡(luò)特性參數(shù)測(cè)量,但隨著時(shí)代的發(fā)展與技術(shù)的進(jìn)步,傳統(tǒng)測(cè)量方法已不能滿足實(shí)際需求。計(jì)算機(jī)技術(shù)與控制理論的高速發(fā)展則為這一問題的解決提供了一個(gè)良好的契機(jī),將微波測(cè)量與自動(dòng)測(cè)量系統(tǒng)相結(jié)合已成為微波測(cè)量領(lǐng)域的一個(gè)發(fā)展方向。而虛擬儀器技術(shù)的出現(xiàn)更是推動(dòng)了這一方向的發(fā)展。本文以虛擬儀器技術(shù)為基礎(chǔ),深入研究了與其相關(guān)的各種開發(fā)技術(shù),并且根據(jù)實(shí)際需求搭建了一個(gè)綜合測(cè)試平臺(tái)。其中包括總線選取、儀器程控、硬件配置等多個(gè)技術(shù)要點(diǎn)。平臺(tái)設(shè)計(jì)的重點(diǎn)是通用性,即在同一個(gè)測(cè)試平臺(tái)上完成多個(gè)測(cè)試項(xiàng)目,這樣不僅可以增加儀器的利用率,還可以降低總體的測(cè)試成本。此外還考慮了測(cè)試智能化的問題,即在軟件開發(fā)過程中做一些有針對(duì)性的設(shè)計(jì),簡(jiǎn)化測(cè)試流程,降低使用難度。在總體測(cè)試平臺(tái)的基礎(chǔ)上,文章主要設(shè)計(jì)了三個(gè)測(cè)試分系統(tǒng)。分別為“軍用設(shè)備電磁發(fā)射自動(dòng)測(cè)量系統(tǒng)”、“雙頻自動(dòng)測(cè)量系統(tǒng)”以及“緊縮場(chǎng)天線方向圖自動(dòng)測(cè)量系統(tǒng)”,其主要內(nèi)容概述如下。“軍用設(shè)備電磁發(fā)射自動(dòng)測(cè)量系統(tǒng)”主要指的是暗室環(huán)境下電磁兼容測(cè)量中的電磁發(fā)射測(cè)試項(xiàng),其依據(jù)標(biāo)準(zhǔn)是GJB151B。解決的問題主要包括硬件調(diào)配與測(cè)控軟件開發(fā),并增加了智能化設(shè)置,降低了操作難度�！半p頻自動(dòng)測(cè)量系統(tǒng)”解決了接收機(jī)以及相關(guān)射頻器件非線性特性的測(cè)量問題。主要包括硬件平臺(tái)的配置、測(cè)試流程設(shè)計(jì)以及測(cè)控軟件開發(fā)三個(gè)方面的內(nèi)容�！熬o縮場(chǎng)天線方向圖自動(dòng)測(cè)量系統(tǒng)”解決了天線方向圖的測(cè)量問題,此外還有增益、半功率波束寬度等參數(shù)的測(cè)量分析。完成的工作主要是軟件開發(fā),包括轉(zhuǎn)臺(tái)控制模塊設(shè)計(jì),矢網(wǎng)控制模塊設(shè)計(jì)以及測(cè)量流程的實(shí)現(xiàn)。技術(shù)上解決了串口通信以及PLC控制問題,能夠比較好地完成測(cè)量任務(wù)。
[Abstract]:Microwave measurement is an important part of electromagnetic field and microwave technology. It is widely used in both military and civil fields. The traditional microwave measurement mainly refers to the signal characteristic parameter measurement and the network characteristic parameter measurement, but with the development of the times and the progress of the technology, the traditional measurement method can not meet the actual demand. The rapid development of computer technology and control theory provides a good opportunity to solve this problem. The combination of microwave measurement and automatic measurement system has become a developing direction in the field of microwave measurement. The emergence of virtual instrument technology has promoted the development of this direction. Based on the virtual instrument technology, this paper deeply studies various development technologies related to virtual instrument, and builds a comprehensive test platform according to the actual demand. Including bus selection, instrument programming, hardware configuration and other technical points. The emphasis of platform design is generality, that is, many test items are completed on the same test platform, which can not only increase the utilization rate of the instrument, but also reduce the overall test cost. In addition, the problem of intelligent testing is considered, that is, to do some targeted design in the process of software development, to simplify the testing process, and to reduce the difficulty of use. On the basis of the overall test platform, three test subsystems are designed in this paper. The main contents are summarized as follows: "automatic measurement system for electromagnetic emission of military equipment", "automatic measurement system for dual frequency" and "automatic measurement system for antenna pattern of compact field". The "automatic measurement system for electromagnetic emission of military equipment" mainly refers to the electromagnetic emission test item in electromagnetic compatibility measurement in dark room environment, which is based on the standard GJB151B. The main problems solved include hardware deployment and development of measurement and control software, and the intelligent setting is added to reduce the difficulty of operation. The dual frequency automatic measurement system solves the problem of measuring the nonlinear characteristics of receiver and related RF devices. It mainly includes the configuration of hardware platform, the design of test flow and the development of measurement and control software. The "Auto-measurement system of Antenna pattern of Compact Field" solves the problem of antenna pattern measurement, in addition to the measurement and analysis of gain, half-power beamwidth and other parameters. The main work is software development, including turntable control module design, vector control module design and the realization of measurement flow. The problem of serial communication and PLC control is solved technically, and the measurement task can be completed well.
【學(xué)位授予單位】：國防科學(xué)技術(shù)大學(xué)
【學(xué)位級(jí)別】：碩士
【學(xué)位授予年份】：2015
【分類號(hào)】：TN015;O441

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