本文選題：傳統(tǒng)校準(zhǔn) + 快速校準(zhǔn)��； 參考：《西安電子科技大學(xué)》2015年碩士論文

【摘要】：隨著微波技術(shù)的不斷發(fā)展,各種微波大功率器件被應(yīng)用于國民經(jīng)濟發(fā)展的各個領(lǐng)域,對微波大功率器件的測試技術(shù)也提出了越來越高的要求,其主要體現(xiàn)在以下兩個方面,首先要求能夠準(zhǔn)確的測得器件在大信號工作狀態(tài)下的輸出阻抗、反射系數(shù)等器件參數(shù),其次越來越注重在測試的一體化、自動化、數(shù)據(jù)處理的等方面的表現(xiàn)。本課題研究的是微波大功率自動測試系統(tǒng)的實現(xiàn)。以微波自動調(diào)配器為核心,完成大功率狀態(tài)下對各微波器件參數(shù)的測量,快速準(zhǔn)確的得到器件在最優(yōu)狀態(tài)下的各參數(shù)值。本文介紹了同軸型微波調(diào)配器的基本原理,分析了調(diào)配器的傳統(tǒng)校準(zhǔn)和基于數(shù)據(jù)擬合的快速校準(zhǔn)理論,通過實際測試完成了方案的驗證。提出了微波大功率自動測試系統(tǒng)的幾項應(yīng)用,其中包括VCO頻率牽引測試、微波功率放大器輸出端反射系數(shù)測試、功率晶體管輸出阻抗測試,進行了各測試的理論研究并提出了測試方案,通過實際的測試驗證了方案的可行性。研究了晶體管噪聲系數(shù)的測試應(yīng)用,并提出了具體的測量步驟。以TestCenter和Visual Studio為軟件開發(fā)平臺,編寫了上述的校準(zhǔn)模塊和幾個測試應(yīng)用的測試軟件,實現(xiàn)了自動測試系統(tǒng)的軟件框架和軟件模塊的調(diào)用,并將數(shù)據(jù)處理再以圖表的形式呈現(xiàn)。現(xiàn)階段基本實現(xiàn)了微波大功率測試系統(tǒng)的功能,下一步的工作主要是在此基礎(chǔ)上不斷的改進和完善各測試的測試方案和軟件模塊,并不斷的添加新的測試應(yīng)用。
[Abstract]:With the continuous development of microwave technology, various microwave high-power devices have been applied in various fields of national economic development, and the testing technology of microwave high-power devices has put forward more and more high requirements, which are mainly reflected in the following two aspects.First, it is required to accurately measure the output impedance, reflection coefficient and other device parameters in the large signal working state. Secondly, more and more attention is paid to the integration of testing, automation, data processing and other aspects of performance.This paper studies the realization of microwave power automatic test system.Taking the microwave automatic modulator as the core, the parameters of each microwave device are measured under the high power condition, and the parameters of the device in the optimal state are obtained quickly and accurately.The basic principle of coaxial microwave modulator is introduced in this paper. The traditional calibration theory and fast calibration theory based on data fitting are analyzed.Several applications of microwave high power automatic test system are presented, including VCO frequency traction test, microwave power amplifier output reflection coefficient test, power transistor output impedance test, etc.The theoretical research of each test is carried out and the test scheme is put forward, and the feasibility of the scheme is verified by the actual test.The test application of transistor noise coefficient is studied, and the measurement steps are put forward.Using TestCenter and Visual Studio as software development platform, the above calibration modules and test software of several test applications are written. The software framework and software module of the automatic test system are called, and the data processing is presented in the form of charts.At this stage, the function of microwave high-power test system is basically realized. The next step is to improve and perfect the test scheme and software module of each test, and to add new test applications.
【學(xué)位授予單位】：西安電子科技大學(xué)
【學(xué)位級別】：碩士
【學(xué)位授予年份】：2015
【分類號】：TN606;TP311.52

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本文編號：1766499